Near Edge X-ray Absorption Fine Structure Spectroscopy with X-Ray Free-Electron Lasers

نویسندگان

  • D. P. Bernstein
  • Y. Acremann
  • A. Scherz
  • M. Burkhardt
  • J. Stöhr
  • M. Beye
  • W. F. Schlotter
  • T. Beeck
  • F. Sorgenfrei
  • A. Pietzsch
  • W. Wurth
چکیده

We demonstrate the feasibility of Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy on solids by means of femtosecond soft x-ray pulses from a free-electron laser (FEL). Our experiments, carried out at the Free-Electron Laser at Hamburg (FLASH), used a special sample geometry, spectrographic energy dispersion, single shot position-sensitive detection and a data normalization procedure that eliminates the severe fluctuations of the incident intensity in space and photon energy. As an example we recorded the D1 N4,5-edge absorption resonance of La3+-ions in LaMnO3. Our study opens the door for x-ray absorption measurements on future x-ray FEL facilities.

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تاریخ انتشار 2009